The radial parallax broadening is the variance of the depth at which a photon
converts, so it scales with the attenuation length. That length was approximated as
photoelectric-dominated and scaled by lambda^3 from a single 13 keV reference per
material. For silicon above 10 keV that is within 0.2%, but for CdTe it overstates
the attenuation length by up to a factor of two, and by six above the cadmium K edge -
which made this variance term 1.9x too large on 750 um CdTe data.
Take the length from the same tabulated coefficients the efficiency correction uses.
Silicon data is unaffected to within the approximation's own error; CdTe data gets a
spot-width variance that matches the sensor it was recorded on.
Co-Authored-By: Claude Opus 5 <noreply@anthropic.com>
Claude-Session: https://claude.ai/code/session_01EFEJG6WBQv8th4UJFNe53N
leonarski_fandClaude Opus 5
9b96906150
