Update Instructions

2024-03-15 17:00:41 +01:00
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# SSB
**Single Side Band ptychography** requires due to its principle dense sampling, focused probe and detector cover 1$`\alpha`$ at least.
Design pipeline:
|Point|Set|Get|Check|
|---|---|---|----|
|1|defocus to 0 | | |
|2|beam energy | contrast transfer function | |
|3|probe semi-angle | contrast transfer function | spatial frequencies in sample |
|4|magnification | field of view | |
|5|scanning matrix | sampling | for atomic resolution around 0.2 - 0.4 A|
|6|camera length | detector cover| just over 1 alfa, check for recommended |
|7|dwell time | electron dose | consider binning and maximal detector frame rate |
|8|probe current | electron dose | compare with sample hardness, is it reasonable for given resolution?|
![instructionsssb](uploads/6d89164fc1d41ce256487045f767a1d7/instructionsssb.png)
# Iterative reconstruction
**Iterative reconstruction techniques** allow sparse sampling, both focused and defocused probe, but need to cover densely sampled diffraction patterns to high angles.
Design pipeline:
|Point|Set|Get|Check|
|---|---|---|----|
|1|beam energy | contrast transfer function | |
|2|probe semi-angle | contrast transfer function | spatial frequencies in sample |
|3|magnification | field of view | |
|4|scanning matrix + defocus | sampling and overlap | beam size in probe window, overlap > 60 % |
|5|dwell time | electron dose | binning and maximal frame rate|
|6|camera length | reconstructed pixel size | pumping aperture limitation, low angle approximation, det. cover < 1 alfa, defocused probe do not fit in probe window, will you have any counts at detector angles higher than 4(5)$`\alpha`$? |
|7|probe current | electron dose | compare with sample hardness, is it reasonable for given resolution?|
![instructionsiter](uploads/3928bc5a2ef58691e8bb2d54ee7c7907/instructionsiter.png)
![instructions](uploads/c62d249a89246ea96c41bd53b7f6f930/instructions.PNG)