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List of controls consists of all parameters needed for proper dataset acquisition design. These are taken from calibration file calibrations.xlsx and may differ from microscope to microscope. They are classified by their dominant impact, with potential overlaps (some of them may affect several features).

Electron beam settings
  • Energy energy of primary electron beam in keV
  • Probe probe setting together with chosen probe forming aperture giving the probe current (in two condenser lens system)
  • Defocus moves focus out of the sample plane - enlarges beam diameter
  • Aperture probe forming aperture gives probe semi-angle (α)
Scanning parameters
  • Magnification controls image field of view
  • Matrix gives beam position to position distance + beam defocus = beam overlap
  • Dwell time a time for an electron beam to stay per pixel
Detection
  • Nominal CL sample to detector distance (usually ADF) gives maximal detected angle as well as angular sampling
  • Detector detector used for data collection
  • Use PAAR Pumping Aperture Angular Restriction, in some microscopes, differential pumping aperture which can limit maximal scattering angles for shortest camera lengths
  • Binning reduction in pixel array size usually increases maximum frame rate (when available)
CL guide - build in checks for proper camera length selections for iterative reconstruction
  • Low angle approximation - scattering angle < 10deg (unequally sampled pixel around optical axis versus around detector edge)
  • Ptycho pixel < step size - set step size is smaller than final pixel in reconstructed image - loose of resolution
  • Beam fits inside the probe window - probe window is capable to accommodate for defocused probe
  • Detector cover < 1α - no reconstruction method for such a dataset
  • Detector cover > 6α - usually no scattering beyond 5α

Always carefully check maximal detector frame rate, needed binning and set dwell time!!

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