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test new dfanout outputs

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This commit is contained in:
zimoch
2025-07-31 16:54:30 +02:00
committed by Andrew Johnson
parent 4c40b9f4bb
commit bff913e4d1
2 changed files with 47 additions and 12 deletions
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36
modules/database/test/std/rec/dfanoutTest.c
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@@ -12,27 +12,36 @@
#include "epicsThread.h"
#include "dfanoutRecord.h"
static const char *dfanout_OUT_pvs[] = {"test_dfanout_record.OUTA", "test_dfanout_record.OUTB",
static const char *dfanout_OUT_pvs[] = {
"test_dfanout_record.OUTA", "test_dfanout_record.OUTB",
"test_dfanout_record.OUTC", "test_dfanout_record.OUTD",
"test_dfanout_record.OUTE", "test_dfanout_record.OUTF",
"test_dfanout_record.OUTG", "test_dfanout_record.OUTH"};
"test_dfanout_record.OUTG", "test_dfanout_record.OUTH",
"test_dfanout_record.OUTI", "test_dfanout_record.OUTJ",
"test_dfanout_record.OUTK", "test_dfanout_record.OUTL",
"test_dfanout_record.OUTM", "test_dfanout_record.OUTN",
"test_dfanout_record.OUTO", "test_dfanout_record.OUTP"};
static const char *dfanout_receivers[] = {"test_dfanout_outa", "test_dfanout_outb",
static const char *dfanout_receivers[] = {
"test_dfanout_outa", "test_dfanout_outb",
"test_dfanout_outc", "test_dfanout_outd",
"test_dfanout_oute", "test_dfanout_outf",
"test_dfanout_outg", "test_dfanout_outh"};
"test_dfanout_outg", "test_dfanout_outh",
"test_dfanout_outi", "test_dfanout_outj",
"test_dfanout_outk", "test_dfanout_outl",
"test_dfanout_outm", "test_dfanout_outn",
"test_dfanout_outo", "test_dfanout_outp"};
void recTestIoc_registerRecordDeviceDriver(struct dbBase *);
static void test_all(int val, int exception){
// if exception < 0 or > 8 then it tests all.
// if mask == -1 then it tests all.
int i;
for (i = 0; i < NELEMENTS(dfanout_receivers); ++i) {
if ( i == exception) continue;
testdbGetFieldEqual(dfanout_receivers[i], DBF_LONG, val);
}
}
static void test_all_output(void){
@@ -54,6 +63,7 @@ static void test_all_output(void){
static void test_selm_specified() {
/* Resetting values */
testDiag("Testing Specified");
testdbPutFieldOk("test_dfanout_src.VAL", DBF_LONG, 0);
test_all(0, -1);
@@ -91,10 +101,11 @@ static void test_selm_mask() {
testdbPutFieldOk("test_dfanout_src.VAL", DBF_LONG, 0);
test_all(0, -1);
/* Resets values. Tests if fields in bitmask have been set */
int mask;
for (mask = 0; mask <= 255; ++mask) {
/* Testing all 65535 possible masks seems a bit excessive -- just test some patterns */
epicsUInt32 mask = 0x100055aa;
while (1) {
testDiag("Testing mask 0x%04x", mask);
/* Resets values. Tests if fields in bitmask have been set */
testdbPutFieldOk("test_dfanout_record.SELM", DBF_STRING, "All"); //Setting all values to 1 so we know what to compare with.
testdbPutFieldOk("test_dfanout_src.VAL", DBF_LONG, 1);
@@ -112,14 +123,15 @@ static void test_selm_mask() {
}
}
if (!mask) break;
mask >>= 1;
}
}
MAIN(dfanoutTest) {
testPlan(3455);
testPlan(1005);
testdbPrepare();
testdbReadDatabase("recTestIoc.dbd", NULL, NULL);

23
modules/database/test/std/rec/dfanoutTest.db
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@@ -31,3 +31,26 @@ record(ai, "test_dfanout_outg") {
record(ai, "test_dfanout_outh") {
}
record(ai, "test_dfanout_outi") {
}
record(ai, "test_dfanout_outj") {
}
record(ai, "test_dfanout_outk") {
}
record(ai, "test_dfanout_outl") {
}
record(ai, "test_dfanout_outm") {
}
record(ai, "test_dfanout_outn") {
}
record(ai, "test_dfanout_outo") {
}
record(ai, "test_dfanout_outp") {
}