AEK_8220_Libraries/firmware_vhdl_evr320
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Fix for issue #5 (wrong endianness of data stream in test bed) #6

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straumann_t merged 1 commits from fix_issue_#5 into master 2021-02-24 11:47:13 +01:00
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straumann_t commented 2021-02-24 11:17:11 +01:00 (Migrated from git.psi.ch)
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The 'evr320_data_filter' entity presents data in little-endian format.
However, the test is written for big-endian; set the SWAP generic to
fix this.

Also; once this test passes events won't be detected because the checksum
timeout is not reached. Set to zero.

Last: ghdl complains about mem_data(x) indexing when x > C_MEM_DATA_WIDTH.
Replaced hard-coded statements by a simple loop that runs from
0 to C_MEM_DATA_WIDTH/8 - 1.

The 'evr320_data_filter' entity presents data in little-endian format. However, the test is written for big-endian; set the SWAP generic to fix this. Also; once this test passes events won't be detected because the checksum timeout is not reached. Set to zero. Last: ghdl complains about mem_data(x) indexing when x > C_MEM_DATA_WIDTH. Replaced hard-coded statements by a simple loop that runs from 0 to C_MEM_DATA_WIDTH/8 - 1.
straumann_t commented 2021-02-24 11:18:11 +01:00 (Migrated from git.psi.ch)
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mentioned in issue #5

mentioned in issue #5
stef_b commented 2021-02-24 11:47:13 +01:00 (Migrated from git.psi.ch)
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merged

merged
stef_b commented 2021-02-24 11:47:13 +01:00 (Migrated from git.psi.ch)
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mentioned in commit df8522473d

mentioned in commit df8522473d53f9a4bcd9318553754566fb555d7b
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Reference: AEK_8220_Libraries/firmware_vhdl_evr320#6