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some debugging of the post processing funcs

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git-svn-id: file:///afs/psi.ch/project/sls_det_software/svn/slsDetectorsPackage@66 08cae9ef-cb74-4d14-b03a-d7ea46f178d7
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bergamaschi
2013-11-27 11:18:20 +00:00
parent 429c25142c
commit dc15bccaa6
4 changed files with 40 additions and 16 deletions
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9
manual/manual-main/singlePhotonCounting-FAQ.tex
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@ -89,6 +89,8 @@ If the range where both requirements are satisfied is large, try to increase the
\section{How does the flat field correction work?}
\subsection{Why isn't my flat-field flat?}
The main reasons of a non flat flat-field can be:
@ -190,9 +192,10 @@ Click on \textit{Trim} to start the noise trimming process. After the trimming h
\end{center}
\caption{The trimmed threshold scan.}\label{fig:thresholdscantrimmed}
\end{figure}
\textbf{
%\subsubsubsection{
Improve the trimming using X-rays}\label{sec:improvetrimming}\\
\textbf{Improve the trimming using X-rays}\label{sec:improvetrimming}\\
The improvement of the trimming acquired with noise is not essential: at 12~keV an untrimmed module has a threshold dispersion which is about 1.4~keV and is already reduced to 200~eV at 12~keV by the noise trimming. At lower energies the noise trimming will be more effective, while the threshold dispesion will be still larger at higher energies. The trimming improvement reduces the threshold dispersion to 140~eV at 12~keV and is expected to be almost constant at all energies. For this reason it is suggested to perform the trimming improvement only when a small threshold dispersion is really important (e.g. to avoid flat field corrections or in presence of fluorescent lines close to the threshold value) and it will probably be not worthy at lower energies (i.e. threshold lower than 6~keV and X-ray energy lower than 12~keV).
The procedure for the trimming improvement is as follows: